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Magnetic Field Modulated Photoreflectance Study of the Electron Effective Mass in Dilute Nitride Semiconductors

AIP Conf. Proc. 1399, pp. 23-24; doi:http://dx.doi.org/10.1063/1.3666239 (2 pages)

PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors
Date: 25–30 July 2010
Location: Seoul, (Korea)
N. Mori1, K. Hiejima1, H. Kubo1, A. Patanè2, and L. Eaves2

1Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2‐1 Yamada‐oka, Suita, Osaka 565‐0871, Japan
2School of Physics & Astronomy, University of Nottingham, Nottingham NG7 2RD, United Kingdom

Magnetic field modulated photoreflectance measurements are performed on the dilute nitride semiconductor Ga(AsN) in quantizing magnetic fields. From the measured cyclotron energies, the conduction band effective mass and its dependence on the nitrogen content are determined. The effective mass is found to become significantly heavier in samples with high nitrogen composition (>0.1%).

© 2011 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 07.55.Db

    Generation of magnetic fields; magnets

  • 03.70.+k

    Theory of quantized fields

  • 78.20.Mg

    Photorefractive effects

  • 75.30.Kz

    Magnetic phase boundaries (including classical and quantum magnetic transitions, metamagnetism, etc.)

ARTICLE DATA

PUBLICATION DATA

ISSN

0094-243X (print)  

ISBN:

978-0-7354-1002-2


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