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13TH INTERNATIONAL CONFERENCE ON X-RAY ABSORPTION FINE STRUCTURE-XAFS13

13th International Conference on X-ray Absorption Fine Structure-XAFS13

Britt Hedman, Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, MS69, Menlo Park, CA, USA ; Piero Pianetta, Stanford Linear Accelerator Center, Stanford, CA, USA


AIP Conference Proceedings 882


Conference Location and Date: Stanford, California, USA, 9-14 July 2006

Subseries: None

Published February 2007; ISBN 978-0-7354-0384-0 One Volume, Print; 960 pages; 8.5 X 11 inches, double column; Hardcover; $346.00

Readership: X-ray absorption spectroscopy practitioners, from those in the theory field through methodology development, instrument developers, and beam line staff. Many scientists in the applied fields of science. Synchrotron radiation facilities in general.

The scope of this Conference was X-ray Absorption Fine Structure (XAFS) and related techniques and topics using synchrotron radiation. Many techniques and theories focusing on XAFS-related phenomena are presented. These techniques are used in many scientific areas to study electronic and real space structure of a multitude of materials.

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