SYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentation

Eighth International Conference on Synchrotron Radiation Instrumentation

Tony Warwick, Lawrence Berkeley National Laboratory, Advanced Light Source, Berkeley, CA, USA ; John Arthur, Stanford Synchrotron Radiation Laboratory, Bldg. 137/Room 212, Stanford, CA, USA ; Howard A. Padmore, Lawrence Berkeley National Laboratory, Advanced Light Source, Berkeley, CA, USA ; Joachim Stöhr, Stanford Synchrotron Radiation Laboratory, Bldg. 137/Room 313, Menlo Park, CA, USA

Conference Location and Date: San Francisco, California, 25-29 August 2003

Subseries: Accelerators and Beams

Published May 2004; ISBN 0-7354-0179-9 CD-ROM (sold separately); 1452 pages; 8.5 X 11 inches, single column; Hardcover; $145.00

Readership: Scientific and engineering staff at synchrotron radiation research facilities; university and industrial researchers engaged in synchrotron radiation research.

All papers were peer-reviewed. These proceedings collect the papers presented at the Eighth International Conference on Synchrotron Radiation Instrumentation, held in San Francisco, August 25th to 29th 2003. This conference takes place every three years, hosted by synchrotron research centers around the world. It is the principal meeting for developers of synchrotron radiation techniques. This particular meeting hosted 650 delegates and there are about 350 published papers in the proceedings. This proceedings series is an essential reference work for practitioners of the field. It documents the evolution and development of techniques. Many of the ideas that become standard practice in synchrotron radiation research appear first in these volumes, often with the definitive explanation and rationale for the technique in question. Topics include: radiation sources, undulators and wigglers, beamlines, diagnostics, monochromator development, optics development, optics metrology, detectors, spectrometers and interferometers, development of equipment and techniques, crystallography and diffractometry systems, imaging, and time resolved techniques.

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