SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference, STM'03

12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques

Paul M. Koenraad, Eindhoven University of Technology, Physics Department, Eindhoven, THE NETHERLANDS ; Martijn Kemerink, Eindhoven University of Technology, Physics Department, Eindhoven, THE NETHERLANDS

Conference Location and Date: Eindhoven, The Netherlands, 21-25 July 2003

Subseries: Materials Physics and Applications

Published December 2003; ISBN 0-7354-0168-3 One Volume Print, CD-ROM included; 1047 pages; 6 3/8 X 9 1/4 inches; Hardcover; $155.00

Readership: Professionals working in the field of nanotechnology as well as scientists working with scanning probes in physics, chemistry, or biology. The proceedings will be especially important for those who are building and/or designing new Scanning Probe Microscopy (SPM) systems for the manipulation and analysis of single atoms, molecules, clusters, or biological entities and those who are looking for new applications of SPM in the fields of physics, chemistry, or biology. Not only concepts, system design, probe manufacturing, and new applications are discussed, but also novel theoretical approaches to understand SPM techniques are presented.

All papers were peer reviewed for these proceedings. At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed. Special emphasis was placed on the manipulation and analysis of single atoms, molecules, nanostructures, and biological entities like DNA, viruses, or cells and the analysis of materials and surfaces on the atomic or molecular level.

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