SPECTRAL LINE SHAPES: Volume 11, 15th ICSLS

15th ISCLS: Spectral Line Shapes Volume 11

Joachim Seidel, Physikalisch-Technische Bundesanstalt, Department of High-Temperature Physics and Vacuum, Berlin, GERMANY

Conference Location and Date: Berlin, GERMANY, 10-14 July 2000

Subseries: Atomic, Molecular, and Optical Physics

Published April 2001; ISBN 1563969912 One Volume, Print; 528 pages; 6 3/8 x 9 1/4 inches; $155.00

Readership: Graduate students and research scientists working in the fields of optics and spectroscopy, astronomy and astrophysics, plasma physics, atomic and molecular physics, earth and atmospherical sciences, combustion and environmental research (remote sensing).

The biennial ICSLS conferences review the most recent theoretical and experimental advances in both fundamental and applied work dealing with the formation of spectral line profiles, the underlying physical processes, and the use of line shape analysis for diagnostic applications. Spectral line shapes and shifts are affected by the interactions between atoms, molecules, ions, electrons and photons. Therefore, their measurement and interpretation provides information on the physical properties of all kinds of material systems, from astrophysical and nuclear-fusion plasmas to superfluid helium droplets. Topics discussed in these proceedings include dense plasmas, hydrogen plasma broadening, asymmetry, nonhydrogenic line profiles, plasma-diagnostic and other applictions, general theory, high-resolution spectroscopy, alkalidoped helium clusters, molecules and atoms, optical collisions, collision-induced effects, doppler broadening and velocity-changing collisions, and related topics.

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