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STRESS INDUCED PHENOMENA IN METALLIZATION: Fourth International Workshop

Stress Induced Phenomena in Metallization

Hidekazu Okabayashi, NEC Corporation, Tsukuba, Ibaraki, JAPAN ; Paul S. Ho, The University of Texas at Austin, Interconnect and Packaging Group, Austin, TX, USA ; Shoso Shingubara, Hiroshima University, Dept. Elec. Engineering, Higashi-hiroshima, JAPAN


AIP Conference Proceedings 418


Conference Location and Date: Tokyo, Japan, 4-6 June 1997

Published ; ISBN 1-56396-682-4 ; pages;

Readership:

Related AIP Titles:
CP# Editor(s) Title
945Ogawa, et al.STRESS-INDUCED PHENOMENA IN METALLIZATION: Ninth International Workshop on Stress-Induced Phenomena in Metallization
817Zschech, et al.STRESS-INDUCED PHENOMENA IN METALLIZATION: 8th International Workshop on Stress-Induced Phenomena in Metallization
741Ho, et al.STRESS-INDUCED PHENOMENA IN METALLIZATION: Seventh International Workshop on Stress-Induced Phenomena in Metallization
612Baker, et al.STRESS INDUCED PHENOMENA IN METALLIZATION: Sixth International Workshop On Stress Induced Phenomena In Metallization