The American Institute of Physics congratulates this year's Nobel Laureates in Physics, Serge Haroche and David J. Wineland “for ground-breaking experimental methods that enable measuring and manipulation of individual quantum systems.
CrossMark Implemented on AIP journals
AIP Publishing is dedicated to scientific accuracy and integrity and as a result has implemented CrossMark on its publications. As of December 2012, a CrossMark logo will appear on an HTML page or PDF file indicating that the publisher is maintaining the published document through any updates, corrections, enhancements, retractions, and other such changes. Clicking the CrossMark logo reveals status information about the document and tells readers whether they are accessing the most recent and reliable version or not. A link to any updated version will be included. You can learn more about CrossMark from the CrossRef website.
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Norman F. Ramsey, the 1989 Nobel Laureate in Physics and inventor of many highly-influential instruments and techniques, died on Friday, November 4, 2011. Among his other accomplishments, Ramsey's efforts led to the development of the MRI, the atomic clock, and the establishment of Brookhaven National Laboratory. Ramsey also served on the Governing Board of the American Institute of Physics (1980-86), and as the President of the American Physical Society (1978-79). AIP is honored to have published a portion of Dr. Ramsey’s work.
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100,000th Paper Marks Significant Milestone for AIP Conference Proceedings Series
AIP Publishing announces the publication of the 100,000th paper in its AIP Conference Proceedings series, a watershed event in the program's rich history. The proceedings volume that contains the 100,000th article isThe IX International Conference on Quark Confinement and the Hadron Spectrum - QCHS-IX. Read the full press release.
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AIP and NIST Make Semiconductor Research Freely Available Online
Through an agreement with the National Institute of Standards and Technology (NIST), proceedings papers from the entire International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly Characterization and Metrology for ULSI Technology) series are now freely available from both organizations' websites. Read the full press release.
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